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Chen XJ, Yang LZ, Deng ZH, Fan WC (2000) Journal of Infrared and Millimeter Waves 19(6), 463-466.
文章来源:WOS    作者:SKLFS    发布时间:2011-08-15

Chen XJ, Yang LZ, Deng ZH, Fan WC (2000) Test and diagnosis of electric circuitry by IR thermal imaging. Journal of Infrared and Millimeter Waves 19(6), 463-466. [In Chinese]

Web link: Keywords:

electric circuitry; infrared thermal image; diagnosis; modeling;

Abstract: A model of IR thermal diagnosis for electric circuitry was established. The temperature profile on the circuitry surface was measured by a thermal video system. And then the inner metallic conductor's temperature was calculated through the developed model to find hidden troubles of malfunction and fire in early stage. A model simulating the different running conditions of the circuitry was also developed to extend the application scope.

 
 
相关链接
Chen XJ, Yang LZ, Deng ZH, Fan WC (2000) Journal of Infrared and Millimeter Waves 19(6), 463-466.
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